A high quantization resolution and low power consumption single slope ADC scheme, for CMOS image sensor applications is proposed. The proposed scheme is composed of the variable gain amplifier,preamplifier and the dynamic latch comparator. Compared to the prior art structure, the proposed circuit can achieve a reasonable noise performance, consume less power and occupy smaller chip area. This proposed ADC is implemented as a column-parallel ADC array inside a fabricated CMOS image sensor chip.The experimental results verify the conception proposed in this paper.%本文提出了一种应用于CMOS图像传感器中的高精度低功耗单斜坡模数转换器(single slope analog-to-digital converter)设计方案.该ADC方案由可变增益放大器、前置预放大器和动态锁存比较器组成.相比现有的设计方案,本文提出的电路在不牺牲噪声性能的前提下,具有更低的功耗和更小的芯片面积.通过集成列并行的单斜坡模数转换器在最新设计的高精度高速CMOS图像传感器设计中,实验结果证明了设计的有效性.
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