Test data and test power are the two major concerns during integrated circuits test. The proposed technique, low power test data conpression technique for reconfigurable MUXs network,can effectively reduce test data and test power. The technique made full use of "idle" test channels to reduce test power without compression ratio loss. Under the guide of minimizing power consumption, some "useful" test channels are split, which means some scan chains driven by "useful" channels are adjusted to be driven by "idle" channels. The method,how to select channels and how to split the selected channels,was illustrated. Experimental results show the effectiveness of the proposed technique in reducing average power and peak power.%测试数据和测试功耗是集成电路测试时关注的两个主要问题.为缩减测试数据体积和降低测试功耗,提出了一种基于可重构MUXs网络的低功耗测试数据压缩方法.这种方法在保持压缩率不变的前提下,充分利用MUXs网络中"空闲"的测试通道来降低测试功耗.在降低测试功耗原则的指导下,将一些"有用"的测试通道进行拆分,即将这些"有用"通道驱动的一部分扫描链改由"空闲"的通道来驱动.提出了怎样选择通道,怎样将选择的通道进行拆分方法.实验结果表明建议的方法有效降低了测试时的平均功耗和峰值功耗.
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