Department of Materials Science and Engineering;
Beijing University of Aeronautics and Astronautics;
LM3 ESA CNRS 8006;
ENSAM;
151 Bd. del'Hpital Paris 75013;
France;
Department of Materials Science and Engineering;
Beijing University of Aeronautics and Astronautics;
LM3 ESA CNRS 8006;
ENSAM;
151 Bd. del'Hpital Paris 75013;
France;
TiAl based alloy; X ray diffraction technique; X ray elastic constant; duplex structure residual stress;