Characterization of spectral hole depth in Tm^(3+) :YAG within the cryogenic temperature range

著录项

• 来源
  《中国物理：英文版》 |2013年第6期|413-417|共5页
• 作者

  陈雷; 马秀荣; 王伟; 张双根; 穆宽林; 王夏洋; 张世宇;

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• 作者单位

  Engineering Research Center on Communication Devices(Ministry of Education);

  School of Computer and Communication Engineering;

  Tianjin University of Technology;

  Tianjin Key Laboratory of Film Electronic and Communication Device;

  School of Electronic Information Engineering;

  Tianjin University of Technology;

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• 原文格式 PDF
• 正文语种 chi
• 中图分类 光谱学;
• 关键词

  phonon process; spectral hole depth; spectral hole width; Tm3+:YAG;