首页> 中文期刊> 《中国物理:英文版》 >Vertical MBE growth of Si fins on sub-10 nm patterned substrate for high-performance FinFET technology

Vertical MBE growth of Si fins on sub-10 nm patterned substrate for high-performance FinFET technology

         

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  • 来源
    《中国物理:英文版》 |2021年第7期|674-678|共5页
  • 作者单位

    Department of Micro-Nanoelectronics Peking University Beijing 100871 China;

    Beijing National Laboratory for Condensed Matter Physics and Institute of Physics Chinese Academy of Sciences Beijing 100190 China;

    Department of Micro-Nanoelectronics Peking University Beijing 100871 China;

    Department of Micro-Nanoelectronics Peking University Beijing 100871 China;

    Department of Micro-Nanoelectronics Peking University Beijing 100871 China;

    Department of Micro-Nanoelectronics Peking University Beijing 100871 China;

    Department of Micro-Nanoelectronics Peking University Beijing 100871 China;

    Beijing National Laboratory for Condensed Matter Physics and Institute of Physics Chinese Academy of Sciences Beijing 100190 China;

    Department of Micro-Nanoelectronics Peking University Beijing 100871 China;

    Beijing Laboratory of Future IC Technology and Science Peking University Beijing 100871 China;

  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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