1-D quasiperiodic(Fibonacci)Cu/Ti metallic superlattices have been pared tn a dual magnetron sputter deposition system.X-ray scattering measurements of these samples are presented・The X-ray diffraction peaks at low angles can be indexed by the projection method from the high-dimensional periodic structure.In the high angle region,there is one broad peak,which indicates that the samples are amorphous.
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机译:SYNTHESIS AND CHARACTERIZATION OF NEW ALKOXOTITANATES OF YTTRIUM, BARIUM, AND COPPER - SINGLE CRYSTAL X-RAY DIFFRACTION STRUCTURES OF CL2Y(TI-2(OPRI)(9)), (TI(OPRI)(5))BA(TI-2(OPRI)(9)), AND CLCU(TI-2(OPRI)(9))
机译:Ultra low energy SIMS, XTEM and X-ray diffraction methods for the characterization of a MBE growth short period (Si{sub}nGe{sub}m){sub}16 superlattices