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王洪喆; 郑松生; 陈朝;
College of Energy;
Xiamen University;
少数载流子寿命; 退火温度; 寿命提高; p型掺杂; 直拉硅; 硼掺杂; 化学钝化; 光致;
机译:Minority carrier lifetime degradation in boron-doped Czochralski silicon
机译:Injection level dependence of the defect-related carrier lifetime in light-degraded boron-doped Czochralski silicon
机译:MINORITY CARRIER LIFETIME IN IONhyphen;IMPLANTED AND ANNEALED SILICON
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