首页> 中文期刊> 《中国物理快报:英文版》 >Near-Field Optical Identification of Metallic and Semiconducting Single-Walled Carbon Nanotubes

Near-Field Optical Identification of Metallic and Semiconducting Single-Walled Carbon Nanotubes

         

摘要

Single-walled carbon nanotubes(SWCNTs),due to their outstanding electrical and optical properties,are expected to have extensive applications,such as in transparent conductive fims and ultra-small field-effect transistors(FETs).However,those applications can only be best realized with pure metallic or pure semiconducting SWCNTs.Hence,identifying and separating metallic from semiconducting SWCNTs in as-grown samples are crucial.In addition,knowledge of the type of an SWCNT is also important for further exploring its new properties in fundamental science.Here we report employing scanning near-field optical microscopy(SNOM)as a direct and simple method to identify metallic and semiconducting SWCNTs on SiO2/Si substrates.Metallic and semiconducting SWCNTs show distinct near-field optical responses because the metallic tubes support plasmons whereas the semiconducting tubes do not.The reliability of this method is verified using FET testing and Rayleigh scattering spectroscopy.Our result demonstrates that the SNOM technique provides a reliable,simple,noninvasive and in situ method to distinguish between metallic and semiconducting SWCNTs.

著录项

相似文献

  • 中文文献
  • 外文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号