首页> 中文期刊> 《中国物理快报:英文版》 >Minority Carrier Lifetime in As-Grown Germanium Doped Czochralski Silicon

Minority Carrier Lifetime in As-Grown Germanium Doped Czochralski Silicon

         

摘要

The minority carrier lifetime of as-gown germanium-doped Czochralski(GCZ)silicon wafers doped with germanium concentrations[Ge]=1016-1018 cm-3 is investigated in comparison with conventional CZ silicon samples.It is found that the lifetime distribution along the ingot changes with the variation of[Ge].There is a critical value of[Ge]=1016 cm-3 beyond which Ge can obviously influence the lifetime of as-grown ingots.This phenomenon is considered to be associated with the competition or combination between the oxygen related thermal donors (TDs)and electrically active Ge-related complexes.The related formation mechanisms and distributions are also discussed.

著录项

  • 来源
    《中国物理快报:英文版》 |2008年第2期|651-653|共3页
  • 作者单位

    State Key Laboratory of Silicon Materials and Department of Material Science and Engineering,Zhejiang University,Hangzhou,310027;

    State Key Laboratory of Silicon Materials and Department of Material Science and Engineering,Zhejiang University,Hangzhou,310027;

    State Key Laboratory of Silicon Materials and Department of Material Science and Engineering,Zhejiang University,Hangzhou,310027;

    State Key Laboratory of Silicon Materials and Department of Material Science and Engineering,Zhejiang University,Hangzhou,310027;

    State Key Laboratory of Silicon Materials and Department of Material Science and Engineering,Zhejiang University,Hangzhou,310027;

    State Key Laboratory of Silicon Materials and Department of Material Science and Engineering,Zhejiang University,Hangzhou,310027;

  • 原文格式 PDF
  • 正文语种 chi
  • 中图分类 物理学;
  • 关键词

获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号