First Overtone Frequency Stimulated Quartz Tuning Fork Used for Shear-Force Scanning Near-Field Optical Microscopy

刘晟; 孙家林; 孙红三; 谭晓靖; 时硕; 郭继华; 赵钧

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First Overtone Frequency Stimulated Quartz Tuning Fork Used for Shear-Force Scanning Near-Field Optical Microscopy

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The conventional 32.768 kHz tuning fork is stimulated at its first overtone resonant frequency of ～190 kHz for shear-force distance control.The time constant is measured to be 0.54 ms and it decreases about 40 times faster than that of the fundamental frequency(20.76ms).The cross section of a corn root with a height difference of ～ 3μm is imaged at a scan speed of 12μm/s for 256 × 256 pixels.

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《中国物理快报：英文版》 |2003年第11期|1928-1931|共4页
作者
刘晟; 孙家林; 孙红三; 谭晓靖; 时硕; 郭继华; 赵钧;
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Key Laboratory of Atomic and Molecular Nanosciences of Education Ministry and Department of Physics,Tsinghua University,Beijing 100084;

Key Laboratory of Atomic and Molecular Nanosciences of Education Ministry and Department of Physics,Tsinghua University,Beijing 100084;

CAAD Laboratory,Tsinghua University,Beijing 100084;

Key Laboratory of Atomic and Molecular Nanosciences of Education Ministry and Department of Physics,Tsinghua University,Beijing 100084;

Key Laboratory of Atomic and Molecular Nanosciences of Education Ministry and Department of Physics,Tsinghua University,Beijing 100084;

Key Laboratory of Atomic and Molecular Nanosciences of Education Ministry and Department of Physics,Tsinghua University,Beijing 100084;

Key Laboratory of Atomic and Molecular Nanosciences of Education Ministry and Department of Physics,Tsinghua University,Beijing 100084;

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First Overtone Frequency Stimulated Quartz Tuning Fork Used for Shear-Force Scanning Near-Field Optical Microscopy

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