Measurement of Random Surface Parameters of Weak Scatterers using the Speckle Contrast Method

程传福; 刘春香; 滕树云; 张宁玉; 李儒新; 徐至展

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Measurement of Random Surface Parameters of Weak Scatterers using the Speckle Contrast Method

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Theoretical analysis shows that the deviation roughness ω and the lateral correlation length ξ of a weak scattering object determine the different properties of the contrast of the speckles in the image plane of a 4f system. Experimentally, we have measured the data of the speckle contrast versus the radius R of the variable filtering aperture. By fitting the theoretical results to these data, we extract the parameters ω and ξ of the random surfaces with Gaussian correlation. This method can determine the two parameters simultaneously and independently, and pre-calibrations are not needed.

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《中国物理快报：英文版》 |2002年第9期|1283-1286|共4页
作者
程传福; 刘春香; 滕树云; 张宁玉; 李儒新; 徐至展;
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Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, PO Box 800-211, Shanghai 20180;

Department of Physics, Shandong Normal University, Ji'nan 250014;

Department of Physics,Shandong Normal University,Ji'nan,250014;

Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, PO Box 800-211, Shanghai 201800;

Shandong Institute of Architecture,Ji'nan 250014;

Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, PO Box 800-211, Shanghai 201800;

Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, PO Box 800-211, Shanghai 201800;

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正文语种 chi
中图分类物理学;
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Measurement of Random Surface Parameters of Weak Scatterers using the Speckle Contrast Method

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