首页> 中文期刊> 《中国物理快报:英文版》 >Photoluminescence Properties of a-SiC:H Films Grown by Plasma Enhanced Chemical Vapor Deposition from SiH_(4)+C_(2)H_(2) Gas Mixtures

Photoluminescence Properties of a-SiC:H Films Grown by Plasma Enhanced Chemical Vapor Deposition from SiH_(4)+C_(2)H_(2) Gas Mixtures

         

摘要

The films of a-SiC:H were deposited by plasma enhanced chemical vapor deposition system from SiH_(4)+C_(2)H_(2) gas mixtures.The C-rich a-SiC:H films were easily obtained by using C_(2)H_(2) gases due to the low dissociation energy of C_(2)H_(2) molecule in the plasma.Thus,the carbon was effectively incorporated into a-Si:H network.Although the defect state densities were proportional to carbon content in a-SiC:H films,the photoluminescence intensities were not directly related with defect density,yet increased with the carbon content increasing.The infrared spectra indicated that CHn groups as clusters were incorporated mainly into a-SiC:H network.The little correlation of the PL integrated intensity with defect state density suggested that luminescence was associated with clusters as a largely intracluster process.

著录项

  • 来源
    《中国物理快报:英文版》 |1998年第11期|P.837-839|共3页
  • 作者单位

    Institute of Theoretical Physics Northeast Normal University Changchun 130024;

    Institute of Theoretical Physics Northeast Normal University Changchun 130024;

    Institute of Theoretical Physics Northeast Normal University Changchun 130024Department of Preventive Medicine Bethune University of Medical Sciences Changchun 130024;

    Institute of Theoretical Physics Northeast Normal University Changchun 130024;

    Department of Chemistry Jilin University Changchun 130023;

    Department of Chemistry Jilin University Changchun 130023;

  • 原文格式 PDF
  • 正文语种 chi
  • 中图分类 固体物理学;
  • 关键词

    process; defect; incorporated;

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