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>The L-shell ionization of Ho and Os induced by electron impact
The L-shell ionization of Ho and Os induced by electron impact
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摘要
The electron-induced L-shell X-ray par- tial production cross sections, total production cross sections and mean ionization cross sections for Ho and Os have been measured as functions of electron energies from near threshold up to 36 keV by using a thin target with thick substrate technique. The influ- ence of the electrons reflected from the substrate was corrected by using the electron transport biparti- tion model. Also, the corrected measured results were compared with theoretical predictions proposed by Gryzinski and McGuire.
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机译:High-performance liquid chromatography/electron capture atmospheric pressure chemical ionization-mass spectrometric determination of biologically active steroids