首页>
中文期刊>
《电子器件冷却与温度控制期刊（英文）》
>Fabrication and Characterization of PLD-Grown Bismuth Telluride (Bisub2/subTesub3/sub) and Antimony Telluride (Sbsub2/subTesub3/sub) Thermoelectric Devices
Fabrication and Characterization of PLD-Grown Bismuth Telluride (Bisub2/subTesub3/sub) and Antimony Telluride (Sbsub2/subTesub3/sub) Thermoelectric Devices
We report on the fabrication and characterization of multi-leg bismuth telluride (Bi2Te3) and antimony telluride (Sb2Te3) thermoelectric devices. The two materials were deposited, on top of SiO2/Si substrates, using Pulsed Laser Deposition (PLD). The SiO2 layer was used to provide insulation between the devices and the Si wafer. Copper was used as an electrical connector and a contact for the junctions. Four devices were built, where the Bi2Te3 and Sb2Te3 were deposited at substrate temperatures of 100°C, 200°C, 300°C and 400°C. The results show that the device has a voltage sensitivity of up to 146 μV/K and temperature sensitivity of 6.8 K/mV.
展开▼
