Limitations of On-Wafer Calibration and De-Embedding Methods in the Sub-THz Range

著录项

• 来源
  《电脑和通信（英文）》 |2013年第6期|25-29|共5页
• 作者

  Manuel Potereau; Christian Raya; Magali De Matos; Sébastien Fregonese; Arnaud Curutchet; Min Zhang; Bertrand Ardouin; Thomas Zimmer;

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• 作者单位

  1IMS Laboratory;

  University of Bordeaux 1;

  Talence;

  France;

  2XMOD Technologies;

  Bordeaux;

  France;

  IMS Laboratory;

  University of Bordeaux 1;

  Talence;

  France;

  IMS Laboratory;

  University of Bordeaux 1;

  Talence;

  France;

  XMOD Technologies;

  Bordeaux;

  France;

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• 原文格式 PDF
• 正文语种 chi
• 中图分类 肿瘤学;
• 关键词

  TRL; Open-Short; De-Embedding; Calibration;