首页> 中文期刊> 《电子与封装》 >无铅锡银密封焊试验及可靠性分析

无铅锡银密封焊试验及可靠性分析

         

摘要

采用Sn3.5Ag(221℃)Indium8.9 T3-83.5%的焊膏,首先做了焊料的可焊性试验,随后设计了围框的密封焊试验,工艺样件由Cu80W镀金底板和柯伐镀金围框组成,在270℃恒定温度下,焊接时间2 min。最后对焊接后的样件做了X-ray空洞率及焊接层面微观检测分析并测量了IMC厚度。研究结果表明:不仅Sn3.5Ag焊料的可焊性好,而且在镀金层上的致密性也好,在X光透射下柯伐镀金围框的空洞率低于5%,只是随时可能产生的小气孔会严重影响焊接的密封性。%Sn3.5Ag(221℃)Indium8.9 T3-83.5% soldering paste was employed to do the weld ability test at the ifrst. Later, a smart plan was schemed for enclosure frame seal-welding experiments. The processing samples are made up of a Cu80W gold-plated substrate and two Kovar alloy enclosure frames with gold-plated. The welding temperature was set at 270℃constantly and time was about 2 minutes. At last, the packaged samples were used for X-ray penetration rate inspection, welding layer microanalysis and IMC thickness measurement. Results show that the spread-ability of Sn3.5Ag is good, the generated solder is actually compacted in the gold-plated inner layer and it also can be easily found that the Kovar alloy enclosure frame void ratio less than 5% based on the X-ray test. However, the small voids that may be produced at any time will have a strong impact on seal-welding.

著录项

相似文献

  • 中文文献
  • 外文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号