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高效率并行熔丝方案的设计

         

摘要

随着集成电路的迅速发展,熔丝在电路设计中应用普遍,测试对熔丝的要求也越来越高,需要更好的准确度和更快的效率。熔丝可以修调的参数当然也取决于该熔丝在电路中的作用,输出电压、参考电压是最为常见的修调参数,此外如基准频率、电流等也都可以通过修调做到很高的精度。简单介绍了常见的熔丝以及其作用,常用的熔丝并行测试的优势和缺陷,提出了在大于4 site测试时,进一步提高熔丝修调准确性以及修调速度的测试方法。%With the popularization of IC design, trimming fuse is applied more generally in Circuit Design. Testing of fuse requirements are also increasing. The better accuracy and faster productivity are useful for us. The parameters of trimming depends on the role of IC. The output voltage and the reference voltage are the most common trimming parameters. In addition, such as the reference frequency, current can also be done by trimming high accuracy. This paper briefly describes common fuse as well as its role, the advantages and disadvantages of conventional parallel testing of fuses, and presents at greater than 4 site testing, to further improve the accuracy of the fuse trimming and testing methods trim speed.

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