Carbon nanotubes as tips for atomic force microscopy

著录项

• 来源
  《哈尔滨工业大学学报：英文版》 |2004年第2期|223-227|共5页
• 作者

  国立秋; 徐宗伟; 赵铁强; 赵清亮; 张飞虎; 董申;

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• 作者单位

  Precision Engineering Research Institute;

  Harbin Institute of Technology;

  Harbin 150001 China School of Mechanical Engineering;

  Tsinghua University;

  Beijing 100084;

  China;

  Precision Engineering Research Institute;

  Harbin Institute of Technology;

  Harbin 150001 China;

  Precision Engineering Research Institute;

  Harbin Institute of Technology;

  Harbin 150001 Chinardinary AFM probes'characters prevent the AFM' s application in various scopes. Carbon nanotubes represent ideal AFM probe materials for their higher aspect ratio;

  larger Young's modulus;

  unique chemical structure;

  and well-defined electronic property. Carbon nanotube AFM probes are obtained by using a new method of attaching carbon nanotubes to the end of ordinary AFM probes;

  and are then used for doing AFM experiments. These experiments indicated that carbon nanotube probes have higher elastic deformation;

  higher resolution and higher durability. And it was also found that carbon nanotube probes ean accurately reflect the morphology of deep narrow gaps;

  while ordinary probes can not reflect.;

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• 原文格式 PDF
• 正文语种 chi
• 中图分类 显微镜;特种结构材料;
• 关键词

  碳纳米管; 探针; 原子力显微镜; 弹性形变; 表面形态; 材料;

  机译：碳纳米管;原子力显微镜（AFM）;探针;