Multiple bit upsets mitigation in memory by using improved hamming codes and parity codes

祝名; 肖立伊; 田欢

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Multiple bit upsets mitigation in memory by using improved hamming codes and parity codes

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This paper combines improved Hamming codes and parity codes to assure the reliability of memory in presence of multiple bit upsets with low cost overhead.The redundancy bits of improved Hamming codes will be appended at the end of data bits,which eliminates the overhead of interspersing the redundancy bits at the encoder and decoder.The reliability of memory is further enhanced by the layout architecture of redundancy bits and data bits.The proposed scheme has been implemented in Verilog and synthesized using the Synopsys tools.The results reveal that the proposed method has about 19% less area penalties and 13% less power consumption comparing with the current two-dimensional error codes,and its latency of encoder and decoder is 63% less than that of Hamming codes.

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《哈尔滨工业大学学报：英文版》 |2010年第5期|726-730|共5页
作者
祝名; 肖立伊; 田欢;
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作者单位

Microelectronics Center;

Harbin Institute of Technology;

National Key Laboratory of Science and Technology on Reliability Physics and Application Technology of Electrical Component;

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原文格式 PDF
正文语种 chi
中图分类设计;
关键词
memory; multiple bit upsets; improved hamming codes; two-dimensional error codes;

Multiple bit upsets mitigation in memory by using improved hamming codes and parity codes

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