首页> 中文期刊> 《测试科学与仪器》 >Effects of precursor solution concentration on dielectric properties of (Pb, La) (Zr, Ti)O3 antiferroelectric thick films by sol-gel processing

Effects of precursor solution concentration on dielectric properties of (Pb, La) (Zr, Ti)O3 antiferroelectric thick films by sol-gel processing

         

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  • 来源
    《测试科学与仪器》 |2013年第3期|294-298|共5页
  • 作者单位

    Key Laboratory of Instrumentation Science & Dynamic Measurement(North University of China),Ministry of Education, Taiyuan 030051, China;

    Key Laboratory of Instrumentation Science & Dynamic Measurement(North University of China),Ministry of Education, Taiyuan 030051, China;

    Key Laboratory of Instrumentation Science & Dynamic Measurement(North University of China),Ministry of Education, Taiyuan 030051, China;

    Key Laboratory of Instrumentation Science & Dynamic Measurement(North University of China),Ministry of Education, Taiyuan 030051, China;

    Key Laboratory of Instrumentation Science & Dynamic Measurement(North University of China),Ministry of Education, Taiyuan 030051, China;

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  • 正文语种 eng
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