通过对具有孔洞和掺杂微米颗粒的不同功能电介质材料的表面电荷动态特性进行比较，研究了材料内部孔洞结构和微米颗粒结构对于其电荷陷阱，表面电荷稳定性能的影响。得出了电介质材料内部孔洞对于电荷的存储和保持具有重要的作用，同时，在聚合物基体中掺杂少量微米颗粒能够起到抑制电荷形成，增大表面电荷衰减率的效果。该研究成果对于绝缘和功能电介质材料的应用基础具有重要的参考价值和现实意义。%From the comparison of dynamic characteristics of surface charge between different functional die-lectric materials with micro voids and micron particles, the influence of voids and micron particles on the charge traps and stability of surface charge is investigated. The storing and retaining effects of inner voids are concluded. Meanwhile,a small amount of micron particle in polymer matrix can play an important role in the charge inhibition and increasing decay rate of surface charge. The study is of great significance on the applica-tion fundamental of insulation and functional dielectric materials.
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