首页> 中文期刊> 《西北工业大学学报》 >一种自主恢复的高可靠存储控制器设计

一种自主恢复的高可靠存储控制器设计

         

摘要

单粒子效应是星载计算机工作异常和故障的重要诱因之一,国内外多颗卫星遭受到单粒子效应的危害,已造成巨大的经济损失。提出了一种片上自主恢复存储控制器结构,将 EDAC 技术集成在片内存储器控制器中,通过 EDAC 电路检测片外存储器中的数据错误,再通过自动回写机制更新片外存储器,便能保持存储器中数据的正确性。与传统的星载计算机存储器系统设计方案相比,使处理器干预主存储器纠错的频度大幅减少。集成的片上存储控制器也减少了星载计算机系统设计的负担。%Reviewing some past research[1-4], we have come to believe that SEU (single event upset) is the main reason for fault or even failure of satellite-borne computer.This paper proposes a reliable memory controller that can write corrected data back into memory automatically .Figure 2 shows the state transition for the main finite state ma -chine, which can enter an “error” state to correct the error if an error is detected during a data read cycle .A mem-ory protection register is defined and the structure of the protection unit is shown in Figure 5.Figure 6 shows the re-liable data path, which uses EDAC circuit to detect and correct errors .Figure 7 shows the automatic recovery flow while Figures 8, 9 and 10 analyze the behavior of the memory controller when an error occurs and it is shown that single bit error in a data can be corrected and , after correction, written back into memory automatically .

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