To estimate the life of vacuum fluorescent display (VFD) more accurately and reduce test time and cost, four constant stress accelerated life tests (CSALTs) were conducted on an accelerated life test model. In the model, statistical analysis of test data is achieved by applying lognormal function to describe the life distribution, and least square method (LSM) to calculate the mean value and the standard deviation of logarithm. As a result, the accelerated life equation was obtained, and then a self-developed software was developed to predict the VFD life. The data analysis results demonstrate that the VFD life submits to lognormal distribution, that the accelerated model meets the linear Arrhenius equation, and that the precise accelerated parameter makes it possible to acquire the life information of VFD within one month.
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