The grahene film with high electrical conductivity was fabricated via two-step reduction method. The structure of the films were studied by means of XPS, Raman, and the electrical property was investigated by four-probe resistance measurement instrument. The results show that graphene film fabricated through the two-step reduction method has higher reduction degree than that only reduced by hydrazine hydrate. The atomic ratio of C to O in the graphene film is 8. 9. The sheet resistance of graphene film is 0. 42 kΩ/□, which is much lower than that of the film reduced by hydrazine hydrate with the same thickness (5. 57 kΩ/□).%通过两步还原法制备了导电石墨烯薄膜.采用XPS、Raman等表征了薄膜的结构；采用四探针电阻仪表征了薄膜电学性能.结果表明:用两步法制备的石墨烯薄膜具有更高的还原程度,其碳和氧的原子比达8.9∶1；薄膜的方块电阻为0.42 kΩ/□,而同等厚度的一次还原薄膜的方块电阻为5.57 kΩ/□.
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