采用溶胶-凝胶工艺及旋转涂膜法制得厚度为800nm的CsH2 PO1/SiO2复合质子交换膜,利用X射线衍射仪与傅里叶变换红外光谱仪分析该膜的晶相和化学构造.通过扫描电镜观察,确认该膜致密、均匀,并且CsH2 PO4晶粒分散于膜中.在80～280℃的温区、低湿度环境下,测定该复合质子交换膜的质子传导性能,其质子传导面阻在160℃时为0.1Ω· cm2.%The CsH2PO4/SiO2 composite film with a thickness of 800 nm was obtained by sol-gel method and spin coating process. The phase components and the chemical bond constitution of the composite film were characterized by X-ray diffraction and FT-IR spectrograph respectively. Scanning electron microscopy (SEM) observation shows that the composite film has a homogeneous, dense structure, in which CsH2PO4 crystal grains are embedded dispersedly. Proton conducting property of the composite film ranging from 80℃ up to 280℃ under low moisture ambience was measured. As a result, at 160℃, the area specific resistance(ARS) of the composite film is 0. 1Ω · cm2.
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