A generation system of 3D testing benchmark circuit compatible with 2D physical design flow is proposed. The IBM-PLACE testing benchmark circuit is used as the test example for the transformation experiment to provide a set of 3D testing reference circuit. The system can transform the different input files into the corresponding Bookshelf library files or DEF library files,and realize the automatic transformation of the connection information of the circuit's interconnection nets,standard cell size,port information,standard cell coordinate information and layout information in the physical design library. It can trans-form the arbitrary 2D circuit design into the 3D testing benchmark circuit,is compatible with the physical design flow of the 2D integrated circuit,and can be used in the locating and wiring in traditional physical design EDA tools. The self-customized 3D testing benchmark circuit is realized.%提出一种与2D物理设计流程兼容的3D测试基准电路生成系统,并以IBM-PLACE测试基准电路为测试试例做了转换实验,提供一套3D测试基准电路.通过此系统,可以根据输入文件的不同,自动转换为对应的Bookshelf库文件或者DEF库文件,实现物理设计库中的电路的互联线网连接信息,标准单元尺寸、端口信息,标准单元坐标信息以及布局信息自动转换.可以将任意2D电路设计转换为3D测试基准电路,并且兼容2D集成电路的物理设计流程,可在传统物理设计EDA工具中布局布线.最终,可以实现自定制的3D测试基准电路.
展开▼
