Single Event effects testing was done on CCD related commercial Integrated Circuits(ICs) Using the Cyclotron Facility at Institute of Modern Physics, Chinese Academy of Science. The ICs were including CCD signal processor,high speed video D/A converter and CCD timing Driver. The CCD signal processor and video D/A converter were found Single Event Latch - up(SEL) sensitive as ion's Linear Energy Transfers(LET) was 30 MeV·cm2/mg,and the cross sections were 2.97×10-5cm2/device and 2.25×10-4cm2/device respectively. The CCD timing Driver was not sensitive to SEL as ion's LET was 37 MeV·cm2/mg and flux was up to107 cm-2 .%采用中科院近代物理研究所回旋加速器产生的重离子(Kr),对商用的CCD外围器件进行单粒子效应试验研究,包括CCD信号处理器AD9945、高速视频D/A转换器ADC7123以及CCD时钟驱动器CXD3400等.试验得到AD9945、ADV7123在离子线性能量转移(Linear Energy Transfes,LEF)为30MeV?cm2/mg时,均发生单粒子锁定(single Event Latch-up,SEL)现象,锁定截面分别为2.97×10-5cm2/器件和2.25×10-4cm2/器件;器件发生SEL时工作电流可达正常工作电流数倍,同时出现功能丧失,需断电重启才能恢复.试验发现CXD3400在离子LET为38 MeV?cm2/mg、辐照通量达107cm-2 时,未发生SEL现象.
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