Analytic fitting and simulation methods for characteristic X-ray peaks from Si-PIN detector

LI Zhe; TUO Xianguo; SHI Rui; ZHOU Jianbin

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Analytic fitting and simulation methods for characteristic X-ray peaks from Si-PIN detector

机译：Si-PIN探测器的特征X射线峰的解析拟合和模拟方法

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A semi-empirical detector response function(DRF)model is established to fit characteristic X-ray peaks recorded in Si-PIN spectra,which is mainly composed of four components:a truncated step function,a Gaussian-shaped full-energy peak,a Gaussian-shaped Si escape peak and an exponential tail.A simple but useful statistical distribution-based analytic method(SDA)is proposed to achieve accurate values of standard deviation for characteristic X-ray peaks.And the values of the model parameters except for the standard deviation are obtained by weighted least-squares fitting of the pulse-height spectra from a number of pure-element samples.A Monte Carlo model is also established to simulate the X-ray measurement setup.The simulated flux spectrum can be transformed by Si-PIN detector response function to real pulse height spectrum as studied in this work.Finally,the fitting result for a copper alloy sample was compared with experimental spectra,and the validity of the present method was demonstrated.

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《核技术（英文版）》 |2013年第6期|43-49|共7页
作者
LI Zhe; TUO Xianguo; SHI Rui; ZHOU Jianbin;
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作者单位

Provincial Key Laboratory of Applied Nuclear Techniques in Geosciences, Chengdu University of Technology, Chengdu 610059, China;

State Key Laboratory of Geohazard Prevention and Geoenvironment Protection, Chengdu University of Technology, Chengdu 610059, China;

Southwest University of Science and Technology, Mianyang 621010, China;

Provincial Key Laboratory of Applied Nuclear Techniques in Geosciences, Chengdu University of Technology, Chengdu 610059, China;

Provincial Key Laboratory of Applied Nuclear Techniques in Geosciences, Chengdu University of Technology, Chengdu 610059, China;

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Analytic fitting and simulation methods for characteristic X-ray peaks from Si-PIN detector

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