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首页> 中文期刊> 《核技术：英文版》 >Investigation of maximum proton energy for qualified ground based evaluation of single-event effects in SRAM devices

Investigation of maximum proton energy for qualified ground based evaluation of single-event effects in SRAM devices

         
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Existing standards show a clear discrepancy in the specification of the maximum proton energy for qualified ground-based evaluation of single-event effects,which can range from 180 to 500 MeV. This work finds that the threshold linear energy transfer of a tested device is a critical parameter for determining the maximum proton energy. The inner mechanisms are further revealed. Highenergy deposition events(>10 MeV) in sensitive volumes are attributed to the interaction between protons and the tungsten vias in the metallization layers.

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