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Energy calibration of a CR-39 nuclear-track detector irradiated by charged particles

机译:带电粒子辐照的CR-39核径迹探测器的能量校准

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摘要

Charged particle diagnosis is an important aspect of laser–plasma experiments conducted at super-intense laser facilities. In recent years, Columbia Resin #39 (CR-39) detectors have been widely employed for detecting charged particles in laser–plasma experiments. This is because the CR-39 polymer does not respond to electro-magnetic pulses or X-rays. This study presents a method for calibrating the relationship between particle energy and track diameter in a CR-39 detector (TasTrak?) using 3–8 MeV protons, 6–30 MeV carbon ions, and 1–5 MeV alpha particles. The particle tracks were compared under the manufacturer's recommended etching conditions of 6.25 mol/l NaOH at 98 ℃ and under the widely adopted experimental conditions of 6.25 mol/l NaOH at 70 ℃. The results show that if the NaOH solution concentration is 6.25 mol/l, then the temperature of 70 ℃ is more suit-able for etching proton tracks than 98 ℃ and employing a temperature of 98 ℃ to etch alpha-particle and carbon-ion tracks can significantly reduce the etching time. Moreover, this result implies that C3+ ion or alpha-particle tracks can be distinguished from proton tracks with energy above 3 MeV by controlling the etching time. This calibration method for the CR-39 detector can be applied to the diagnosis of reaction products in laser–plasma experiments.
机译:带电粒子诊断是在超强激光设备上进行的激光等离子体实验的重要方面。近年来,Columbia Resin#39(CR-39)检测器已被广泛用于检测激光等离子体实验中的带电粒子。这是因为CR-39聚合物不响应电磁脉冲或X射线。这项研究提出了一种使用3–8 MeV质子,6–30 MeV碳离子和1–5 MeVα粒子校准CR-39检测器(TasTrak?)中的粒子能量与轨道直径之间关系的方法。在制造商建议的98℃的6.25 mol / l NaOH蚀刻条件下和在70℃的6.25 mol / l NaOH的广泛采用的实验条件下比较了颗粒径迹。结果表明,如果NaOH溶液浓度为6.25 mol / l,则70℃的温度比98℃更适合刻蚀质子迹线,并采用98℃的温度刻蚀α粒子和碳离子迹线可以大大减少蚀刻时间。此外,该结果表明,通过控制蚀刻时间,可以将C3 +离子或α粒子轨迹与能量高于3 MeV的质子轨迹区分开。这种用于CR-39检测器的校准方法可用于诊断激光等离子体实验中的反应产物。

著录项

  • 来源
    《核技术(英文版)》 |2019年第6期|1-9|共9页
  • 作者单位

    Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China;

    University of Chinese Academy of Sciences, Beijing 100049, China;

    Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China;

    Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, China;

    Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China;

    University of Chinese Academy of Sciences, Beijing 100049, China;

    ShanghaiTech University, Shanghai 201210, China;

    Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China;

    Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, China;

    Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China;

    Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, China;

    Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China;

    Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, China;

    Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China;

    Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, China;

    Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China;

  • 收录信息 中国科学引文数据库(CSCD);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
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