Development of Contactless Method of the DUT Heating during Single-Event Effect Tests

Vasily S.Anashin; Eugeny V.Mitin; Aleksandr E.Koziukov; Ekaterina N.Nekrasova

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Development of Contactless Method of the DUT Heating during Single-Event Effect Tests

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This paper presents two approaches to perform the electronic device heating during radiation hardness assurance tests.Commonly used conductive heating approach is compared with contactless laser-based approach,characteristics and limitations of these methods are described.Experimental results for temperature dependence of single-event latchup(SEL)cross-section during heavy ion irradiation along with some aspects of physics-based numerical simulation of heat transfer processes are presented.

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《物理科学与应用：英文版》 |2018年第002期|P.22-27|共6页
作者
Vasily S.Anashin; Eugeny V.Mitin; Aleksandr E.Koziukov; Ekaterina N.Nekrasova;
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作者单位

[1]Branch of Joint-Stock Company United Rocket and Space Corporation–Institute Of Space Device Engineering,Moscow 111250,Russia;

[1]Branch of Joint-Stock Company United Rocket and Space Corporation–Institute Of Space Device Engineering,Moscow 111250,Russia;

[1]Branch of Joint-Stock Company United Rocket and Space Corporation–Institute Of Space Device Engineering,Moscow 111250,Russia;

[1]Branch of Joint-Stock Company United Rocket and Space Corporation–Institute Of Space Device Engineering,Moscow 111250,Russia;

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原文格式 PDF
正文语种 CHI
中图分类物理学;
关键词
Single-event effect(SEE)tests; heavy ions; radiation hardness; heating methods; SEL;

机译：单事件效应（SEE）测试;重离子;辐射硬度;加热方法;SEL;

Development of Contactless Method of the DUT Heating during Single-Event Effect Tests

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