首页> 中文期刊> 《科学技术与工程》 >基于频率响应法的双CPU架构变压器绕组变形测试仪设计

基于频率响应法的双CPU架构变压器绕组变形测试仪设计

         

摘要

针对日益增多的变压器绕组变形故障,设计了一种以高性能DSP芯片TMS320F2812及ARMRCortexTM-M3芯片STM320F103为核心的基于频率响应法的变压器绕组变形测试仪.详细介绍了系统硬件设计方案及软件编程思想.DSP模块负责高速数据采集与运算.ARM模块通过SPI总线与DSP通信,实现测试仪的数据管理、用户界面以及联机通讯.采用数字频率合成技术DDS对待测变压器绕组进行扫频测量.系统采用软件滤波和硬件同步交流采样技术减小测量误差.能够在不对变压器进行吊罩、拆装的情况下进行绕组变形测试,显示高、低压三相绕组频率响应曲线及相关系数R.仿真测试结果表明该装置能够满足变压器绕组变形的测试要求.%Against for an increasing number of transformer winding deformation fault, a transformer winding deformation tester is designed which based on the frequency response and used high-performance DSP chip TMS320F2812 and ARMRCortex?-M3-chip STM320F103 as the core, and introduced hardware design and software programming ideas of the system in detail. The DSP module is responsible for high-speed data acquisition and computing; ARM module can communicate with the DSP through the SPI bus that implement the testers data management , user interface and on-line communication. It uses digital frequency synthesis DDS to measure the pending transformer winding and in order to reduce the measurement error, the system uses software filtering and hardware synchronization AC sampling technology. The design can be carried out without the transformer hanging hood and removable, show high or low voltage three-phase winding frequency response curve and correlation coefficient R. The results of the text show that the device can meet the texting requirements of the transformer winding deformation.

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