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首页> 美国卫生研究院文献>Materials >Damage from Coexistence of Ferroelectric and Antiferroelectric Domains and Clustering of O Vacancies in PZT: An Elastic and Raman Study
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Damage from Coexistence of Ferroelectric and Antiferroelectric Domains and Clustering of O Vacancies in PZT: An Elastic and Raman Study

机译：PZT中铁电和反铁电域共存以及O空位聚集造成的损害：弹性和拉曼研究

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摘要

It is often suggested that oxygen vacancies (VO) are involved in fatigue and pinning of domain walls in ferroelectric (FE) materials, but generally without definite evidence or models. Here the progress of damage induced by the coexistence of FE and antiferroelectric (AFE) domains in the absence of electric cycling is probed by monitoring the Young’s modulus, which may undergo more than fourfold softenings without significant changes in the Raman spectra, but may end with the disaggregation of PZT with ∼5% Ti. At these compositions, the FE and AFE phases coexist at room temperature, as also observed with micro-Raman, and hence the observations are interpreted in terms of the aggregation of VO at the interfaces between FE and AFE domains, which are sources of internal electric and stress fields. The VO would coalesce into planar defects whose extension grows with time but can be dissolved by annealing above 600 K, which indeed restores the original stiffness. The observed giant softening is interpreted by assimilating the planar aggregations of VO to flat inclusions with much reduced elastic moduli, due to the missing Zr/Ti−O bonds. A relationship between the coalescence of a fixed concentration of VO into planar defects and softening is then obtained from the existing literature on the effective elastic moduli of materials with inclusions of various shapes.
机译：经常建议氧空位（V < mrow> O ）与铁电（FE）材料中畴壁的疲劳和钉扎有关，但通常没有确切的证据或模型。在这里，通过监测杨氏模量来探测在不存在电循环的情况下由FE和反铁电（AFE）域共存引起的破坏进展，该杨氏模量可能会经历四倍以上的软化，而拉曼光谱没有明显变化，但可能会以用约5％的Ti分解PZT。在这些组成下，FE和AFE相在室温下共存，这也可以用微拉曼观察到，因此，可以根据V O < / mrow> 在FE域和AFE域之间的接口处，这是内部电场和应力场的来源。 V <数学xmlns：mml =“ http://www.w3.org/1998/Math/MathML” id =“ mm3”溢出=“ scroll”> < mi mathvariant =“ normal”> O 会合并为平面缺陷，其扩展性会随着时间而增长，但可以通过在600 K以上退火而溶解，这确实恢复了原始刚度。通过同化V 由于缺少Zr /， O 到弹性模量大大降低的扁平夹杂物Ti-O键。固定浓度的V O 变成平面缺陷，然后从有关有效弹性模量的现有文献中获得软化具有各种形状的内含物的材料。

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