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Standard method for microCT-based additive manufacturing quality control 1: Porosity analysis

机译:基于microCT的增材制造质量控制的标准方法1:孔隙率分析

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摘要

class="kwd-title">Keywords: Additive manufacturing, MicroCT, X-ray, Tomography, Non-destructive testing, Standardization, Porosity class="head no_bottom_margin" id="abs0010title">AbstractMicroCT is a well-established technique that is used to analyze the interior of objects non-destructively, and it is especially useful for void or porosity analysis. Besides its widespread use, few standards exist and none for additive manufacturing as yet. This is due to the inherent differences in part design, sizes and geometries, which results in different scan resolutions and qualities. This makes direct comparison between different scans of additively manufactured parts almost impossible. In addition, different image analysis methodologies can produce different results. In this method paper, we present a simplified 10 mm cube-shaped coupon sample as a standard size for detailed analysis of porosity using microCT, and a simplified workflow for obtaining porosity information. The aim is to be able to obtain directly comparable porosity information from different samples from the same AM system and even from different AM systems, and to potentially correlate detailed morphologies of the pores or voids with improper process parameters. The method is applied to two examples of different characteristic types of voids in AM: sub-surface lack of fusion due to improper contour scanning, and tree-like pores growing in the build direction. This standardized method demonstrates the capability for microCT to not only quantify porosity, but also identify void types which can be used to improve AM process optimization.
机译:<!-fig ft0-> <!-fig @ position =“ anchor” mode =文章f4-> <!-fig mode =“ anchred” f5-> <!-fig / graphic | fig / alternatives / graphic mode =“ anchored” m1-> class =“ kwd-title”>关键字:增材制造,MicroCT,X射线,断层扫描,无损检测,标准化,孔隙率摘要 MicroCT是一种成熟的技术,用于无损分析对象的内部,对于空隙或孔隙度分析特别有用。除了其广泛使用之外,几乎没有标准,也没有关于增材制造的标准。这是由于零件设计,尺寸和几何形状的固有差异,导致不同的扫描分辨率和质量。这样几乎不可能在增材制造零件的不同扫描之间进行直接比较。另外,不同的图像分析方法可以产生不同的结果。在该方法文件中,我们提出了一种简化的10 mm立方样试样作为标准尺寸,用于使用microCT进行孔隙度的详细分析,以及一种简化的获取孔隙度信息的工作流程。目的是能够从相同的AM系统甚至不同的AM系统的不同样品中直接获得可比较的孔隙率信息,并将潜在的孔隙或空隙的详细形态与不合适的工艺参数相关联。该方法适用于AM中空洞的不同特征类型的两个示例:由于轮廓扫描不正确而导致的子表面融合不足,以及在构建方向上生长的树状孔隙。这种标准化的方法证明了microCT不仅可以量化孔隙率,还可以识别可用于改善AM工艺优化的空隙类型。

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