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A High Speed CMOS Image Sensor with a Novel Digital Correlated Double Sampling and a Differential Difference Amplifier

机译:具有新型数字相关双采样和差分差动放大器的高速CMOS图像传感器

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摘要

In order to increase the operating speed of a CMOS image sensor (CIS), a new technique of digital correlated double sampling (CDS) is described. In general, the fixed pattern noise (FPN) of a CIS has been reduced with the subtraction algorithm between the reset signal and pixel signal. This is because a single-slope analog-to-digital converter (ADC) has been normally adopted in the conventional digital CDS with the reset ramp and signal ramp. Thus, the operating speed of a digital CDS is much slower than that of an analog CDS. In order to improve the operating speed, we propose a novel digital CDS based on a differential difference amplifier (DDA) that compares the reset signal and the pixel signal using only one ramp. The prototype CIS has been fabricated with 0.13 µm CIS technology and it has the VGA resolution of 640 × 480. The measured conversion time is 16 µs, and a high frame rate of 131 fps is achieved at the VGA resolution.
机译:为了提高CMOS图像传感器(CIS)的工作速度,描述了一种数字相关双采样(CDS)的新技术。通常,通过复位信号和像素信号之间的减法算法可以降低CIS的固定模式噪声(FPN)。这是因为在具有复位斜坡和信号斜坡的常规数字CDS中通常已采用单斜率模数转换器(ADC)。因此,数字CDS的运行速度比模拟CDS的运行速度慢得多。为了提高工作速度,我们提出了一种基于差分差分放大器(DDA)的新型数字CDS,该差分CDA仅使用一个斜坡就可以比较复位信号和像素信号。 CIS原型采用0.13 µm CIS技术制造,其VGA分辨率为640×480。测得的转换时间为16 µs,在VGA分辨率下可获得131 fps的高帧率。

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