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Estimation of surface impedance at oblique incidence based on sparse array processing

机译:基于稀疏阵列处理的斜入射表面阻抗估计

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摘要

A method is proposed to estimate the surface impedance of a large absorptive panel from free-field measurements with a spherical microphone array. The method relies on the reconstruction of the pressure and the particle velocity on the studied surface using an equivalent source method based on spherical array measurements. The sound field measured by the array is mainly composed of an incident and a reflected wave, so it can be represented as a spatially sparse problem. This makes it possible to use compressive sensing in order to enhance the resolution and the quality of the estimation. The results indicate an accurate reconstruction for angles of incidence between 0° and 60°, and between approximately 200 and 4000 Hz. Additionally, experimental challenges are discussed, such as the sample's finiteness at low frequencies and the estimation of the background noise.
机译:提出了一种利用球形麦克风阵列通过自由场测量来估计大吸收性面板的表面阻抗的方法。该方法依赖于使用基于球面阵列测量的等效源方法在研究表面上重建压力和粒子速度。阵列测量的声场主要由入射和反射波组成,因此可以表示为空间稀疏问题。这使得可以使用压缩感测来提高分辨率和估计质量。结果表明,对于0°和60°之间以及大约200和4000 Hz之间的入射角,可以进行精确的重构。此外,还讨论了实验方面的挑战,例如样品在低频下的有限性和背景噪声的估计。

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