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Fracture mechanics by three-dimensional crack-tip synchrotron X-ray microscopy

机译:三维裂纹尖端同步加速器X射线显微镜观察断裂力学

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摘要

To better understand the relationship between the nucleation and growth of defects and the local stresses and phase changes that cause them, we need both imaging and stress mapping. Here, we explore how this can be achieved by bringing together synchrotron X-ray diffraction and tomographic imaging. Conventionally, these are undertaken on separate synchrotron beamlines; however, instruments capable of both imaging and diffraction are beginning to emerge, such as ID15 at the European Synchrotron Radiation Facility and JEEP at the Diamond Light Source. This review explores the concept of three-dimensional crack-tip X-ray microscopy, bringing them together to probe the crack-tip behaviour under realistic environmental and loading conditions and to extract quantitative fracture mechanics information about the local crack-tip environment. X-ray diffraction provides information about the crack-tip stress field, phase transformations, plastic zone and crack-face tractions and forces. Time-lapse CT, besides providing information about the three-dimensional nature of the crack and its local growth rate, can also provide information as to the activation of extrinsic toughening mechanisms such as crack deflection, crack-tip zone shielding, crack bridging and crack closure. It is shown how crack-tip microscopy allows a quantitative measure of the crack-tip driving force via the stress intensity factor or the crack-tip opening displacement. Finally, further opportunities for synchrotron X-ray microscopy are explored.
机译:为了更好地理解缺陷的形核和生长与引起缺陷的局部应力和相变之间的关系,我们需要成像和应力映射。在这里,我们探索如何通过将同步加速器X射线衍射和层析成像结合在一起来实现这一目标。传统上,这些是在单独的同步加速器光束线上进行的。但是,同时具有成像和衍射功能的仪器开始出现,例如欧洲同步辐射装置的ID15和钻石光源的JEEP。这篇综述探讨了三维裂纹尖端X射线显微镜的概念,将它们组合在一起,以探究在实际环境和载荷条件下的裂纹尖端行为,并提取有关局部裂纹尖端环境的定量断裂力学信息。 X射线衍射提供有关裂纹尖端应力场,相变,塑性区和裂纹面牵引力和力的信息。延时CT除了提供有关裂纹的三维性质及其局部增长率的信息外,还可以提供有关外在增韧机制的激活的信息,例如裂纹偏转,裂纹尖端区域屏蔽,裂纹桥接和裂纹关闭。它显示了裂纹尖端显微镜如何通过应力强度因子或裂纹尖端开口位移来定量测量裂纹尖端驱动力。最后,探索了同步加速器X射线显微镜的更多机会。

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