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Application of confocal surface wave microscope to self-calibrated attenuation coefficient measurement by Goos-Hänchen phase shift modulation

机译:共焦表面波显微镜在Goos-Hänchen相移调制自校正衰减系数测量中的应用

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摘要

In this paper, we present a direct method to measure surface wave attenuation arising from both ohmic and coupling losses using our recently developed phase spatial light modulator (phase-SLM) based confocal surface plasmon microscope. The measurement is carried out in the far-field using a phase-SLM to impose an artificial surface wave phase profile in the back focal plane (BFP) of a microscope objective. In other words, we effectively provide an artificially engineered backward surface wave by modulating the Goos Hänchen (GH) phase shift of the surface wave. Such waves with opposing phase and group velocities are well known in acoustics and electromagnetic metamaterials but usually require structured or layered surfaces, here the effective wave is produced externally in the microscope illumination path. Key features of the technique developed here are that it (i) is self-calibrating and (ii) can distinguish between attenuation arising from ohmic loss (k″Ω) and coupling (reradiation) loss (k″c). This latter feature has not been achieved with existing methods. In addition to providing a unique measurement the measurement occurs of over a localized region of a few microns. The results were then validated against the surface plasmons (SP) dip measurement in the BFP and a theoretical model based on a simplified Green’s function.
机译:在本文中,我们提出了一种直接的方法,可以使用我们最近开发的基于相空间光调制器(phase-SLM)的共聚焦表面等离子体激元显微镜来测量由欧姆损耗和耦合损耗引起的表面波衰减。使用相SLM在远场中进行测量,以便在显微镜物镜的后焦平面(BFP)中施加人造表面波相位轮廓。换句话说,我们通过调制表面波的GoosHänchen(GH)相移有效地提供了人工设计的反向表面波。这种具有相反的相位和群速度的波在声学和电磁超材料中是众所周知的,但通常需要结构化或分层的表面,此处有效波在显微镜照明路径的外部产生。此处开发的技术的主要特征是:(i)是自校准的,并且(ii)可以区分由欧姆损耗(k''Ω)引起的衰减和耦合(重辐射)损耗(k''c)。后一种特征尚未通过现有方法实现。除了提供独特的测量之外,该测量还在几微米的局部区域内进行。然后针对BFP中的表面等离激元(SP)倾角测量以及基于简化格林函数的理论模型对结果进行了验证。

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