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Theoretical Analysis of InGaAs/InAlAs Single-Photon Avalanche Photodiodes

机译:InGaAs / InAlAs单光子雪崩光电二极管的理论分析

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摘要

Theoretical analysis and two-dimensional simulation of InGaAs/InAlAs avalanche photodiodes (APDs) and single-photon APDs (SPADs) are reported. The electric-field distribution and tunneling effect of InGaAs/InAlAs APDs and SPADs are studied. When the InGaAs/InAlAs SPADs are operated under the Geiger mode, the electric field increases linearly in the absorption layer and deviate down from its linear relations in the multiplication layer. Considering the tunneling threshold electric field in multiplication layer, the thickness of the multiplication layer should be larger than 300 nm. Moreover, SPADs can work under a large bias voltage to avoid tunneling in absorption layer with high doping concentrations in the charge layer.
机译:报告了InGaAs / InAlAs雪崩光电二极管(APD)和单光子APD(SPAD)的理论分析和二维模拟。研究了InGaAs / InAlAs APD和SPAD的电场分布和隧穿效应。当InGaAs / InAlAs SPAD在盖革模式下工作时,电场在吸收层中线性增加,而在乘法层中偏离线性关系。考虑到倍增层中的隧穿阈值电场,倍增层的厚度应大于300 nm。此外,SPAD可以在较大的偏置电压下工作,以避免在电荷层中掺杂浓度高的吸收层中发生隧穿。

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