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首页> 美国卫生研究院文献>Nanoscale Research Letters >Unusual surface and edge morphologies sp2 to sp3 hybridized transformation and electronic damage after Ar+ ion irradiation of few-layer graphene surfaces
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Unusual surface and edge morphologies sp2 to sp3 hybridized transformation and electronic damage after Ar+ ion irradiation of few-layer graphene surfaces

机译：Ar +离子辐照几层石墨烯表面后出现异常的表面和边缘形态sp2到sp3的杂化转变和电子损伤

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摘要

Roughness and defects induced on few-layer graphene (FLG) irradiated by Ar+ ions at different energies were investigated using X-ray photoemission spectroscopy (XPS) and atomic force microscopy techniques. The results provide direct experimental evidence of ripple formation, sp2 to sp3 hybridized carbon transformation, electronic damage, Ar+ implantation, unusual defects and edge reconstructions in FLG, which depend on the irradiation energy. In addition, shadowing effects similar to those found in oblique-angle growth of thin films were seen. Reliable quantification of the transition from the sp2-bonding to sp3-hybridized state as a result of Ar+ ion irradiation is achieved from the deconvolution of the XPS C (1s) peak. Although the ion irradiation effect is demonstrated through the shape of the derivative of the Auger transition C KVV spectra, we show that the D parameter values obtained from these spectra which are normally used in the literature fail to account for the sp2 to sp3 hybridization transition. In contrast to what is known, it is revealed that using ion irradiation at large FLG sample tilt angles can lead to edge reconstructions. Furthermore, FLG irradiation by low energy of 0.25 keV can be a plausible way of peeling graphene layers without the need of Joule heating reported previously.
机译：利用X射线光电子能谱（XPS）和原子力显微镜技术研究了在不同能量下Ar + 离子辐照在几层石墨烯（FLG）上引起的粗糙度和缺陷。这些结果为波纹形成，sp 2 到sp 3 杂化碳转化，电子损伤，Ar + 注入，异常缺陷和形成的直接实验证据提供了证据。 FLG中的边缘重建取决于辐射能量。另外，可以看到类似于在薄膜的斜角生长中发现的阴影效果。通过Ar + 离子辐照，可以可靠地量化从sp 2 键到sp 3 杂化状态的跃迁。 XPS C（1s）峰的反卷积。尽管通过俄歇跃迁C KVV光谱的导数的形状证明了离子辐照效果，但我们表明从文献中通常使用的这些光谱获得的D参数值未能解释sp 2 < / sup>到sp 3 杂交过渡。与已知的相反，揭示了在大的FLG样品倾斜角上使用离子辐照会导致边缘重建。此外，以0.25 keV的低能量进行的FLG辐照可能是剥离石墨烯层的一种可行方法，而无需先前报道的焦耳加热。

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