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Mapping TES Temperature Sensitivity and Current Sensitivity as a Function of Temperature Current and Magnetic Field with IV curve and Complex Admittance Measurements

机译:使用IV曲线和复数导纳测量值将TES温度敏感度和电流敏感度映射为温度电流和磁场的函数

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摘要

We have specialized astronomical applications for X-ray microcalorimeters with superconducting transition edge sensors (TESs) that require exceptionally good TES performance, but which operate in the small-signal regime. We have therefore begun a program to carefully characterize the entire transition surface of TESs with and without the usual zebra stripes to see if there are reproducible local “sweet spots” where the performance is much better than average. These measurements require precise knowledge of the circuit parameters. Here, we show how the Shapiro effect can be used to precisely calibrate the value of the shunt-resistor. We are also investigating the effects of stress and external magnetic fields to better understand reproducibility problems.
机译:对于具有超导过渡边缘传感器(TES)的X射线微热量计,我们有专门的天文应用,这些传感器要求TES性能特别好,但在小信号范围内运行。因此,我们已经启动了一个程序,仔细检查有无普通斑马条纹的TES的整个过渡表面,以查看是否存在可再现的局部“最佳点”,其性能远胜于平均水平。这些测量需要精确了解电路参数。在这里,我们展示了Shapiro效应如何用于精确校准分流电阻器的值。我们还在调查应力和外部磁场的影响,以更好地了解可再现性问题。

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