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Reliability and Remaining Life Assessment of an Electronic Fuze Using Accelerated Life Testing

机译：使用加速寿命测试的电子引信的可靠性和剩余寿命评估

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摘要

An electronic fuze is a one-shot system that has a long storage life and high mission criticality. Fuzes are designed, developed, and tested for high reliability (over 99%) with a confidence level of more than 95%. The electronic circuit of a fuze is embedded in the fuze assembly, and thus is not visible. Go/NoGo fuze assembly mission critical testing does not provide prognostic information about electrical and electronic circuits and subtle causes of failure. Longer storage times and harsh conditions cause degradation at the component level. In order to calculate accrued damage due to storage and operational stresses, it is necessary to perform sample-based accelerated life testing after a certain time and estimate the remaining useful life of mission critical parts. Reliability studies of mechanical parts of such systems using nondestructive testing (NDT) have been performed, but a thorough investigation is missing with regards to the electronic parts. The objective of this study is to identify weak links and estimate the reliability and remaining useful life of electronic and detonating parts. Three critical components are identified in an electronic fuze circuit (1) a diode, (2) a capacitor, and (3) a squib or detonator. The accelerated test results reveal that after ten years of storage life, there is no significant degradation in active components while passive components need to be replaced. The squib has a remaining useful life (RUL) of more than ten years with reliability over 99%.
机译：电子引信是一种单发系统，具有较长的存储寿命和很高的任务关键性。引信的设计，开发和测试具有很高的可靠性（超过99％），置信度超过95％。引信的电子电路嵌入在引信组件中，因此不可见。 Go / NoGo引信装配关键任务测试无法提供有关电气和电子电路以及细微故障原因的预后信息。较长的存储时间和苛刻的条件会导致组件级别的性能下降。为了计算由于存储和操作压力引起的应计损坏，有必要在一定时间后执行基于样本的加速寿命测试，并估算关键任务部件的剩余使用寿命。已经使用无损检测（NDT）对此类系统的机械零件进行了可靠性研究，但是缺少有关电子零件的详尽调查。这项研究的目的是确定薄弱环节，并估计电子零件和引爆零件的可靠性和剩余使用寿命。在电子引信电路中确定了三个关键组件：（1）二极管，（2）电容器和（3）爆管或雷管。加速测试结果表明，经过十年的存储寿命，有源组件没有明显的退化，而被动组件则需要更换。爆管的剩余使用寿命（RUL）超过十年，可靠性超过99％。

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