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首页> 美国卫生研究院文献>Materials >Criticality Hidden in Acoustic Emissions and in Changing Electrical Resistance during Fracture of Rocks and Cement-Based Materials
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Criticality Hidden in Acoustic Emissions and in Changing Electrical Resistance during Fracture of Rocks and Cement-Based Materials

机译：隐藏在声排放中的临界性以及在岩石和水泥材料骨折期间改变电阻的影响

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摘要

Acoustic emissions (AE) due to microcracking in solid materials permit the monitoring of fracture processes and the study of failure dynamics. As an alternative method of integrity assessment, measurements of electrical resistance can be used as well. In the literature, however, many studies connect the notion of criticality with AE originating from the fracture, but not with the changes in the electrical properties of materials. In order to further investigate the possible critical behavior of fracture processes in rocks and cement-based materials, we apply natural time (NT) analysis to the time series of AE and resistance measurements, recorded during fracture experiments on cement mortar (CM) and Luserna stone (LS) specimens. The NT analysis indicates that criticality in terms of electrical resistance changes systematically precedes AE criticality for all investigated specimens. The observed greater unpredictability of the CM fracture behavior with respect to LS could be ascribed to the different degree of material homogeneity, since LS (heterogeneous material) expectedly offers more abundant and more easily identifiable fracture precursors than CM (homogenous material). Non-uniqueness of the critical point by varying the detection threshold of cracking events is apparently due to finite size effects which introduce deviations from the self-similarity.
机译：由于固体材料的微裂纹，声排放（AE）允许监测骨折过程和失效动态的研究。作为完整性评估的替代方法，也可以使用电阻的测量。然而，在文献中，许多研究将源自骨折的AE的临界概念连接，但不是材料的电气性质的变化。为了进一步研究岩石和水泥基材料中断裂过程的可能临界行为，我们将自然时间（NT）分析应用于AE和电阻测量的时间序列，在水泥砂浆（cm）和Luserna上的裂缝实验期间记录石头（LS）标本。 NT分析表明，在电阻变化方面的临界性系统地前后对所有调查标本的累积性。观察到CM断裂行为对LS的更大不可预测性可以归因于不同程度的材料均匀性，因为LS（异质材料）预期提供比cm（均匀材料）更丰富和更容易可识别的骨折前体。通过改变裂化事件的检测阈值的临界点的非唯一性显然是由于有限尺寸的效应，这引入了与自相似性的偏差。

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