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Low-Cost 2D Index and Straightness Measurement System Based on a CMOS Image Sensor

机译:基于CMOS图像传感器的低成本2D指数和直线度测量系统

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摘要

Accurate traceable measurement systems often use laser interferometers for position measurements in one or more dimensions. Since interferometers provide only incremental information, they are often combined with index sensors to provide a stable reference starting point. Straightness measurements are important for machine axis correction and for systems having several degrees of freedom. In this paper, we investigate the accuracy of an optical two-dimensional (2D) index sensor, which can also be used in a straightness measurement system, based on a fiber-coupled, collimated laser beam pointing onto an image sensor. Additionally, the sensor can directly determine a 2D position over a range of a few millimeters. The device is based on a simple and low-cost complementary metal–oxide–semiconductor (CMOS) image sensor chip and provides sub-micrometer accuracy. The system is an interesting alternative to standard techniques and can even be implemented on machines for real-time corrections. This paper presents the developed sensor properties for various applications and introduces a novel error separation method for straightness measurements.
机译:准确的可追踪测量系统通常使用激光干涉仪进行一个或多个维度的位置测量。由于干涉仪仅提供增量信息,因此它们通常与索引传感器组合以提供稳定的参考起点。直线度测量对于机器轴校正和具有多个自由度的系统非常重要。在本文中,我们研究了光学二维(2D)索引传感器的准确性,其也可以基于指向图像传感器的光纤耦合的准直激光束在直线测量系统中使用。另外,传感器可以直接确定在几毫米范围内的2D位置。该装置基于简单且低成本的互补金属氧化物半导体(CMOS)图像传感器芯片,并提供子微米精度。该系统是标准技术的有趣替代方案,甚至可以在用于实时校正的机器上实现。本文介绍了各种应用的发达的传感器性能,并引入了一种用于直线测量的新型误差分离方法。

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