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X-Ray Microscopy of Halide Perovskites: Techniques, Applications, and Prospects

机译：卤化物钙质X射线显微镜：技术，应用和潜在客户

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Abstract X‐ray microscopy can provide unique chemical, electronic, and structural insights into perovskite materials and devices leveraging bright, tunable synchrotron X‐ray sources. Over the last decade, fundamental understanding of halide perovskites and their impressive performance in optoelectronic devices has been furthered by rigorous research regarding their structural and chemical properties. Herein, studies of perovskites are reviewed that have used X‐ray imaging, spectroscopy, and scattering microscopies that have proven valuable tools toward understanding the role of defects, impurities, and processing on perovskite material properties and device performance. Together these microscopic investigations have augmented the understanding of the internal workings of perovskites and have helped to steer the perovskite community toward promising directions. In many ways, X‐ray microscopy of perovskites is still in its infancy, which leaves many exciting paths unexplored including new ptychographic, multimodal, in situ, and operando experiments. To explore possibilities, pioneering X‐ray microscopy along these lines is briefly highlighted from other semiconductor systems including silicon, CdTe, GaAs, CuInxGa1−xSe2, and organic photovoltaics. An overview is provided on the progress made in utilizing X‐ray microscopy for perovskites and present opportunities and challenges for future work.
机译：摘要X射线显微镜可提供独特的化学品，电子和结构见解，进入钙钛矿材料和器件，利用明亮，可调同步旋流X射线源。在过去十年中，通过对其结构和化学性质的严格研究进一后进一后进一后进一步了对光电器件中的卤化物佩洛夫斯基纳斯及其令人印象深刻的性能。在此，综述钙钛矿的研究，该研究已经使用X射线成像，光谱学和散射显微镜，这些显微镜已经证明了理解缺陷，杂质和处理对钙钛矿材料性能和器件性能的作用。这些微观调查共同有助于了解佩罗夫斯基特的内部运作，并有助于将佩洛斯库特社区引向有希望的方向。在许多方面，Perovskites的X射线显微镜仍处于初期阶段，这使得许多令人兴奋的路径未探索，包括新的PTYCHOGUP，MultimoDal，原位和Operando实验。为了探索可能性，从包括硅，CDTE，GaAs，CuinxGA1-XSE2和有机光伏等其他半导体系统简要突出显示沿着这些线的开创性X射线显微镜。概述提供了利用X射线显微镜对佩洛夫斯克斯的进展以及为未来工作的机会和挑战提供的进展。

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