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Photoemission Spectroscopy Characterization of Halide Perovskites

机译：卤化物钙钛矿的光学激散光谱表征

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Abstract Controlling the surface and interface properties of halide perovskites (HaPs) materials is key to improve performance and stability of HaP‐based optoelectronic devices such as solar cells. Here, an overview is given on the use of different photoemission spectroscopy (PES) techniques as a tool kit to investigate chemical and electronic properties of surfaces and interfaces in research on HaP compounds. The primary focus of the article is X‐ray photoelectron spectroscopy (XPS), hard X‐ray photoemission spectroscopy (HAXPES), ultraviolet photoemission spectroscopy (UPS), and inverse photoemission spectroscopy (IPES), highlighting the importance of good practices during PES measurements. Starting from the working principles of PES, critical measurement conditions are discussed. In particular, the exposure of the HaP surface to vacuum and high energy radiation can cause accelerated ageing, degradation, and also ionic migration in the sample. The impact of these changes on the electronic and chemical properties is discussed, followed by an analysis of the specific challenges encountered when performing PES measurements of HaPs. These include the deviation from pristine surface conditions, determination of “soft” band edges, and assessment of band bending. The review concludes by emphasizing good practices for PES measurements of HaP samples and outlining the scope of operando type measurements to capture the transient behavior of HaPs in the experiment.
机译：摘要控制卤化物Perovskites（HAPS）材料的表面和界面性质是提高基于HAP的光电器件（如太阳能电池）的性能和稳定性的关键。这里，对使用不同的光曝光光谱（PE）技术作为工具试剂盒给出概述，以研究HAP化合物研究中表面和界面的化学和电子性质。本文的主要焦点是X射线光电子体谱（XPS），硬X射线照片光谱（HAXPES），紫外线光谱光谱（UPS）和逆光敏光谱（IPES），突出了PES测量期间良好实践的重要性。从PE的工作原则开始，讨论了临界测量条件。特别地，HAP表面暴露于真空和高能量辐射可导致样品中的加速老化，降解和离子迁移。讨论了这些变化对电子和化学性质的影响，然后分析了在执行PEA的PES测量时遇到的特定挑战。这些包括与原始表面条件的偏差，确定“软”带边缘的确定，以及带弯曲的评估。审查通过强调PES测量的PES样本的良好实践并概述了Operando型测量范围，以捕获实验中HAP的瞬态行为。

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