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Langevin and Trap-Assisted Recombination in Phosphorescent Organic Light Emitting Diodes

机译：磷光有机发光二极管中的兰格文和陷阱辅助复合。

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摘要

Bimolecular and trap-assisted recombination mechanisms are investigated in small molecule-based phosphorescent organic light emitting diodes (PhOLEDs) using the current-voltage-luminance characteristics in the diffusion current region, along with transient electroluminescence and capacitance measurements. Two different PhOLEDs, one with a single host, 4,4'-Bis(carbazol-9-yl)biphenyl, and the other with an exciplex-forming co-host, are studied. Trap-assisted recombination with a large number of trapped charges is dominant in the PhOLED with the single host because of the large energy gap between the host and the dopant state. In contrast, bimolecular Langevin recombination is dominant in the PhOLED with the exciplex forming co-host, where a phosphorescent dye is doped in the co-host. As a result, the accumulated charge density is lower in the co-host system than in the single host emission layer, leading to high efficiency that approaches the theoretical limit, with an extremely low efficiency roll-off.
机译：利用扩散电流区域中的电流-电压-亮度特性，以及瞬态电致发光和电容测量，研究了基于小分子的磷光有机发光二极管（PhOLED）中的双分子和陷阱辅助复合机制。研究了两种不同的PhOLED，一种具有单一主体的4,4'-双（咔唑-9-基）联苯，另一种具有形成激基复合物的共主体。在具有单个主体的PhOLED中，具有大量俘获电荷的陷阱辅助重组占主导地位，因为主体和掺杂态之间的能隙很大。相比之下，双分子Langevin重组在具有赋形复合物形成共主体的PhOLED中占主导地位，其中磷光染料掺杂在共主体中。结果，共宿主系统中的累积电荷密度低于单宿主发射层中的电荷密度，导致接近理论极限的高效率以及极低的效率下降。

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  • 来源
    《Advanced Functional Materials》 |2014年第29期|4681-4688|共8页
  • 作者

    Jeong-Hwan Lee; Sunghun Lee; Seung-Jun Yoo; Kwon-Hyeon Kim; Jang-Joo Kim;

  • 作者单位

    Department of Materials Science and Engineering Seoul National University Seoul 151-744, Korea;

    Department of Materials Science and Engineering Seoul National University Seoul 151-744, Korea;

    Department of Materials Science and Engineering Seoul National University Seoul 151-744, Korea;

    Department of Materials Science and Engineering Seoul National University Seoul 151-744, Korea;

    Department of Materials Science and Engineering Seoul National University Seoul 151-744, Korea;

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