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Effect of hole mobility through emissive layer on temporal stability of blue organic light-emitting diodes

机译：穿过发射层的空穴迁移率对蓝色有机发光二极管的时间稳定性的影响

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摘要

Light-emitting conjugated oligomers comprising anthracene, naphthalene, and fluorene units have been synthesized to investigate three configurations of blue organic light-emitting diodes (OLEDs) that are designed to identify the origins of device instability. The transient OLED technique is employed to measure hole mobilities, which are found to be 3.1 x 10(-4), 8.9 x 10(-5), and 3.6 x 10(-5) cm(2) V-1 s(-1) for three different blue-light-emitting model compounds with varying fluorene content. A higher hole mobility through the emissive layer results in a wider recombination zone, which, in turn, is responsible for a longer device lifetime and a lower drive voltage at the expense of luminance yield.
机译：已经合成了包含蒽，萘和芴单元的发光共轭低聚物，以研究蓝色有机发光二极管（OLED）的三种构型，这些构型旨在识别器件不稳定的根源。瞬态OLED技术用于测量空穴迁移率，发现其迁移率分别为3.1 x 10（-4），8.9 x 10（-5）和3.6 x 10（-5）cm（2）V-1 s（- 1）对于三种不同的芴含量不同的蓝色发光模型化合物。穿过发射层的更高的空穴迁移率导致更宽的复合区，这又导致更长的器件寿命和更低的驱动电压，而以亮度产量为代价。

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