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首页> 外文期刊>Advanced Functional Materials >Single-Crystalline Gallium Nitride Microspindles: Synthesis, Characterization, and Thermal Stability
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Single-Crystalline Gallium Nitride Microspindles: Synthesis, Characterization, and Thermal Stability

机译：单晶氮化镓微主轴：合成，表征和热稳定性

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摘要

This paper describes a facile procedure for synthesizing high-quality gallium nitride microspindles on a large scale using a solid-state reaction of GaI_3, NaNH_2, and NH_4Cl in a sealed system at 500 °C for 6 h. The structures, compositions, and morphologies of the as-synthesized products are derived from X-ray powder diffraction (XRD), X-ray photoelectron spectroscopy (XPS), transmission electron microscopy (TEM), and field-emission scanning electron microscopy (FE-SEM). The selected-area electron diffraction (SAED) patterns and high-resolution transmission electron microscopy (HRTEM) images show that the as-synthesized GaN spindles are composed of many single-crystalline platelets. The GaN microspindles show different optical properties depending on their shape (e.g., nanowires or nanoparticles) in photoluminescence (PL) emission spectroscopy and Raman spectroscopy. The possible growth mechanism of GaN microspindles is controlled by linear kinetics with a driving force proportional to the difference between a local supersaturation and an equilibrium chemical potential. Furthermore, the thermal stability of the GaN microspindles is investigated under various annealing conditions and discussed on the basis of additional TEM and XRD analyses.
机译：本文介绍了在密封系统中于500°C下使用GaI_3，NaNH_2和NH_4Cl的固态反应大规模合成高质量氮化镓微锭的简便方法。合成产物的结构，组成和形貌源自X射线粉末衍射（XRD），X射线光电子能谱（XPS），透射电子显微镜（TEM）和场发射扫描电子显微镜（FE） -SEM）。选定区域电子衍射（SAED）模式和高分辨率透射电子显微镜（HRTEM）图像显示，合成后的GaN锭子由许多单晶薄片组成。 GaN微锭在光致发光（PL）发射光谱和拉曼光谱中取决于它们的形状（例如，纳米线或纳米颗粒）显示出不同的光学性质。 GaN微主轴的可能生长机制由线性动力学控制，驱动力与局部过饱和和平衡化学势之间的差异成比例。此外，在各种退火条件下研究了GaN微主轴的热稳定性，并在其他TEM和XRD分析的基础上进行了讨论。

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  • 来源
    《Advanced Functional Materials》 |2004年第5期|p. 464-470|共7页
  • 作者

    Fen Xu; Yi Xie; Xu Zhang; Shuyuan Zhang; Xianming Liu; Wang Xi; Xiaobo Tian;

  • 作者单位

    Structure Research Lab, University of Science and Technology of China, Hefei, Anhui 230026, P.R. China;

    Department of Chemistry, University of Science and Technology of China, Hefei, Anhui 230026, P.R. China;

    Structure Research Lab, University of Science and Technology of China, Hefei, Anhui 230026, P.R. China;

    Structure Research Lab, University of Science and Technology of China, Hefei, Anhui 230026, P.R. China;

    Structure Research Lab, University of Science and Technology of China, Hefei, Anhui 230026, P.R. China;

    Department of Chemistry, University of Science and Technology of China, Hefei, Anhui 230026, P.R. China;

    Department of Chemistry, University of Science and Technology of China, Hefei, Anhui 230026, P.R. China;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;
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