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Future test system architectures

机译:未来的测试系统架构

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摘要

An expanding number of test system architectural choices has caused confusion in the test engineering community. This will show the strengths and weaknesses of existing test system architectures including rack and stack systems with GPIB instruments and modular systems like VXI and PXI. It will provide a glimpse into an emerging new architecture: LAN-based test systems. The paper reviews key concerns such as costs, channel counts, footprints, IO speeds, ease-of-integration, and flexibility. The objective of the paper is to provide engineers insight into the most effective test systems for their future applications.
机译:越来越多的测试系统体系结构选择在测试工程界引起了混乱。这将显示现有测试系统架构的优缺点,包括采用GPIB仪器的机架和堆栈系统以及VXI和PXI等模块化系统。它将一窥新兴的新架构:基于LAN的测试系统。本文回顾了关键问题,例如成本,通道数,占用空间,IO速度,易于集成和灵活性。本文的目的是为工程师提供针对他们未来应用的最有效测试系统的见识。

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